Published date: 23 September 2022
This notice was replaced on 16 December 2022
This notice does not contain the most up-to-date information about this procurement. The most recent notice is:
Awarded contract (published 16 December 2022)
Closed opportunity - This means that the contract is currently closed. The buying department may be considering suppliers that have already applied, or no suitable offers were made.
Contract summary
Industry
Ion microscopes - 38512100
Location of contract
BS8 1TL
Value of contract
£1,900,000
Procurement reference
tender_306451/1108139
Published date
23 September 2022
Closing date
24 October 2022
Closing time
12pm
Contract start date
28 November 2022
Contract end date
27 November 2024
Contract type
Supply contract
Procedure type
Open procedure (above threshold)
Any interested supplier may submit a tender in response to an opportunity notice.
This procedure can be used for procurements above the relevant contract value threshold.
Contract is suitable for SMEs?
Yes
Contract is suitable for VCSEs?
Yes
Description
The scope is divided into two items with both items to be provided by the same supplier as part of one tender.
1. The Supply, Installation, Commissioning, Training and Support of a Plasma Focused Ion Beam (PFIB) Microscope, in the IAC.
2. The Supply, Installation, Commissioning, Training and Support of a new gallium focused ion beam (Ga-FIB) Microscope in the IAC.
The IAC at UoB has identified a need to procure a Plasma-Focused Ion Beam (PFIB) system, which allows for:
- Dual-beam capability with field emission gun scanning electron microscopy (FEGSEM) and plasma-based focused ion beam,
- Micromachining with high milling rates,
- Sample liftout (size reduction),
- Tomography with analytical capability - integrating energy-dispersive X-ray (EDX) and electron backscatter diffraction (EBSD) bought separately from a third party supplier,
- Gas injection using XeF2 enhanced etch, insulator, platinum and carbon, with options of other gas species.
- Cryogenic stage and vacuum transfer capability,
- Preparation of specimens for transmission electron microscopy (TEM) while minimising FIB-induced damage, atom probe tomography (APT) and micromechanical testing.
- Electrical feedthroughs for in-situ characterisation (minimum four channels for four-point resistance measurements).
In addition to the procurement of the PFIB instrument, UoB would like to also as part of this call upgrade the gallium focused ion beam (Ga-FIB) capability of the IAC facility, by procurement of a new Ga-FIB instrument, with the capability for:
- Dual-beam capability with FEGSEM and gallium focused ion beam
- Micromachining and imaging,
- Microcantilever manipulation of specimens for TEM, APT and micromechanical liftouts,
- Gas injection using XeF2 enhanced etch, insulator and organo-metallics containing platinum, with options of other gas species.
Both of these instruments will be utilized within the Interface Analysis Centre (IAC) microscopy and materials facility at UoB, which will be used by a large number of researchers from a large number of UK, European and worldwide Universities, Research Institutes and Industry, thus the equipment and associated software must be simple and straightforward to use, robust and also be sufficiently interlocked to protect the system against accidental misuse.
The funding allocated for this equipment is a maximum of £1,900,000 (ex VAT). Tenders received above this value may be discounted.
About the buyer
Contact name
Lucy Neaves
Address
4th Floor, Augustine's Courtyard, Orchard Lane
Bristol
BS1 5DS
England
Telephone
0
Share this notice
All content is available under the
