Published date: 10 June 2015

Closed opportunity - This means that the contract is currently closed. The buying department may be considering suppliers that have already applied, or no suitable offers were made.


Closing: 8 July 2015

Contract summary

Industry

  • Spectroscopy devices - 33114000

  • Laboratory, optical and precision equipments (excl. glasses) - 38000000

  • Instruments for measuring quantities - 38340000

    • Electron-beam recorders - 38341100

    • Microscopes - 38510000

    • Scanning electron microscopes - 38511100

    • Ion microscopes - 38512100

    • Cooling and ventilation equipment - 42500000

Location of contract

S10 2TN

Value of contract

£800,000 to £1,300,000

Procurement reference

200/YE

Published date

10 June 2015

Closing date

8 July 2015

Contract start date

10 July 2015

Contract end date

10 July 2020

Contract type

Supply contract

Procedure type

Open procedure

Any interested supplier may submit a tender in response to an opportunity notice.

Contract is suitable for SMEs?

Yes

Contract is suitable for VCSEs?

No

Description

The University of Sheffield is out to tender on behalf of the Department of Materials Science and Engineering for a Focused ion beam Facility.

We seek to purchase a Dual Beam Focused Ion Beam -Scanning Electron Microscope instrument. The instrument will be used for the investigation of a wide range of materials, including polymers, metals, ceramics, glasses, composites, semiconductors, nanomaterials, nanostructures and coatings. The instrument will be used for:

a) The ultra-high resolution investigation of the surfaces of materials using both secondary electron (ISE and ESE) and back scattered electron signals.
b) The ability to examine material structure with minimal electron beam damage.
c) The preparation of the highest quality samples for transmission electron microscopy with the ability to undertake high resolution TEM without further sample preparation.
d) To undertake STEM experiments directly in the instrument.
e) To undertake dynamic nanoscale experiments within the microscope.
f) To be able to lithographically ion mill surface structures such as nano-pillars etc.
g) To have the option of undertaking several different analytical techniques in the microscope.
h) To enable the investigation of 3D materials volumes through iterative cutting and imaging of sample surfaces.

For the purposes of this procurement our requirements have been divided into 3 lots as follows:-

Lot 1 - Focused Ion Beam Scanning Electron Microscope (FIB SEM) system.
Lot 2 - Cooling system for FIB SEM.
Lot 3 - Energy Dispersive spectroscopy system for FIB SEM.

Suppliers are welcome to tender for one, two or all Lots.


The closing date for return of tenders is Friday 10th July 2015 at 12 noon (UK time)

Suppliers must register on the University's e-tendering portal in order to access the tender documents and submit their responses.
https://www.in-tendhost.co.uk/sheffield

More information

Links

Additional text

All expressions of interest must be via the University of Sheffield e-tendering portal:
https://www.in-tendhost.co.uk/Sheffield

This is an open tender exercise. The ITT can be downloaded by registering and expressing your interest on the University`s e-tendering system https://www.in-tendhost.co.uk/Sheffield

If you have any questions or comments in relation to this tender they must be submitted via the In-tend System, this can be accessed at https://www.in-tendhost.co.uk/Sheffield

Completed tenders must be returned through the same e-tendering system.


Closing date for receipt of tenders: Friday 10th July 2015 at 12 noon (UK time).


Is a Recurrent Procurement Type? : No https://in-tendhost.co.uk/sheffield/aspx/

About the buyer

Contact name

Yvette Everitt

Address

Firth Court
Western Bank
Sheffield
S10 2TN
United Kingdom

Telephone

https://www.in-tendhost.co.uk/sh

Email

procurement@sheffield.ac.uk