Published date: 13 March 2020

Last edited date: 26 March 2020

Closed opportunity - This means that the contract is currently closed. The buying department may be considering suppliers that have already applied, or no suitable offers were made.


Closing: 29 April 2020

Contract summary

Industry

  • Laboratory, optical and precision equipments (excl. glasses) - 38000000

  • Checking and testing apparatus - 38500000

  • Diffraction apparatus - 38530000

Location of contract

M1 7HS

Value of contract

£0

Procurement reference

2020-1647-XRD-JW-PC

Published date

13 March 2020

Closing date

29 April 2020

Contract start date

17 May 2020

Contract end date

31 December 2020

Contract type

Supply contract

Procedure type

Open procedure (above threshold)

Any interested supplier may submit a tender in response to an opportunity notice.

This procedure can be used for procurements above the relevant contract value threshold.

Contract is suitable for SMEs?

No

Contract is suitable for VCSEs?

No

Description

We require an x-ray diffraction instrument for the Department of Materials X-ray characterization laboratory. We intend to use this diffractometer to characterise polycrystalline and powder samples from a range of research fields. It will be replacing existing specialist equipment optimised to measure in grazing incidence modes to bias the signal from the sample to the top surface layers. The region of interest in the surface layer may have only a few microns of depth or several hundred microns depending on the research field, GO films vs. thermal barrier coatings. We will use the diffractometer in reflection geometry with the 1D or equivalent detector, in order to characterise the 'surface' in terms of: (1) phases present and potential amorphous fractions, (2) simple texture, (3) lattice strains and lattice constants (4) structural refinement. This instrument should allow us to combine in a single experimental batch, depending on the sample characteristics, (1) standard 1D powder diffraction with (2) grazing incidence (GIXRD) to increase the sensitivity to the surface layer (3) simple texture measurement, by rotation of Phi at set intervals during either (1) or (2) and Ω scans. This system must also accommodate a variable temperature measurement capability and large single sample position.

More information

Links

Additional text

Is a Recurrent Procurement Type? : No

About the buyer

Contact name

Paul Carter

Address

Manchester
Manchester
Manchester
M1 7HS
United Kingdom

Telephone

0161 275 2207

Email

paul.carter-2@manchester.ac.uk