Published date: 26 October 2015
Awarded contract - This means that the contract has been awarded to a supplier.
Contract summary
Industry
Microscopes - 38510000
Location of contract
Yorkshire and the Humber
Value of contract
£0
Procurement reference
200/YE
Published date
26 October 2015
Closing date
9 June 2015
Contract start date
25 September 2015
Contract end date
31 March 2016
Contract type
Supply contract
Procedure type
Open procedure
Any interested supplier may submit a tender in response to an opportunity notice.
Contract is suitable for SMEs?
No
Contract is suitable for VCSEs?
No
Description
This contract is a one-off supply only and has now been awarded. Dual Beam Focused Ion Beam -Scanning Electron Microscope instrument. The instrument will be used for the investigation of a wide range of materials, including polymers, metals, ceramics, glasses, composites, semiconductors, nanomaterials, nanostructures and coatings.
For the purposes of this procurement our requirements have been divided into 3 lots as follows:-
Lot 1 - Focused Ion Beam Scanning Electron Microscope (FIB SEM) system.
Lot 2 - Cooling system for FIB SEM.
Lot 3 - Energy Dispersive spectroscopy system for FIB SEM.
More information
Additional text
-
This contract is for a one-off supply of scientific equipment, including warranty and service contracts for 3 or more years.
Award information
Awarded date
25 September 2015
Contract start date
25 September 2015
Contract end date
31 March 2016
Total value of contract
£0
This contract was awarded to 3 suppliers.
FEI UK Ltd
Address
Merlin Place, Milton Rd, Cambridge CB4 0DP
Reference
None
Supplier is SME?
No
Supplier is VCSE?
No
Quorum Technologies Ltd
Address
Eden Business Centre, Ashford, TN23 7RS
Reference
None
Supplier is SME?
No
Supplier is VCSE?
No
Oxford Instruments NanoAnalysis
Address
Halifax Rd, High Wycombe, HP12 3SE
Reference
None
Supplier is SME?
No
Supplier is VCSE?
No
About the buyer
Address
University of Sheffield
Sheffield
S10 2TN
England
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Closing: 9 June 2015
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